Occupation preference values in doped CmIm' multinaries from EXAFS and FTIR correlative analysis

Автор(и)

  • B.V. Robouch Istituto Nazionale di Fisica Nucleare-Laboratori Nazionali di Frascati, Via Enrico Fermi 40, I-00044 Frascati, Italy
  • A. Marcelli Istituto Nazionale di Fisica Nucleare-Laboratori Nazionali di Frascati, Via Enrico Fermi 40, I-00044 Frascati, Italy
  • P. Robouch European Commission, Joint Research Centre, Institute for Reference Materials and Measurements Retieseweg 111, 2440 Geel, Belgium
  • A. Kisiel Instytut Fizyki, Universytet Jagiellonski, Reymonta 4, 30-059 Krakow, Poland

DOI:

https://doi.org/10.1063/1.3570929

Ключові слова:

multinary alloys, EXAFS, (D type) crystal structures.

Анотація

We discuss which x-ray absorption fine structure (EXAFS) data of binary doped CmIm' compound structures can be unfolded to determine elemental bond distances and the deviations from random configurations due to site preference occupations (SOPs). SOP-deviation estimations can be further confirmed by independent Fourier transform infrared (FTIR) data analysis. The limits and restrictions of our model are presented and discussed.

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Опубліковано

2011-01-28

Як цитувати

(1)
Robouch, B.; Marcelli, A.; Robouch, P.; Kisiel, A. Occupation Preference Values in Doped CmIm’ Multinaries from EXAFS and FTIR Correlative Analysis. Fiz. Nizk. Temp. 2011, 37, 308-312.

Номер

Том 37 № 3 (2011)

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