Electron traps in solid Xe
DOI (Low Temperature Physics):
https://doi.org/10.1063/1.3117964Ключові слова:
rare gas solids, thermally stimulated luminescence, exoelectron emission, relaxation processes.Анотація
Correlated real-time measurements of thermally stimulated luminescence and exoelectron emission from solid Xe pre-irradiated with an electron beam were performed. The study enabled us to distinguish between surface and bulk traps in solid Xe and to identify a peak related to electronically induced defects. The activation energy corresponding to annihilation of these defects was estimated by the following methods: the method of different heating rates, the initial-rise method, and the curve cleaning technique with fitting of the thermally stimulated luminescence glow curve.
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Опубліковано
2009-03-04
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(1)
Ivan V. Khyzhniy, Sergey A. Uyutnov, Elena V. Savchenko, Galina B. Gumenchuk, Alexey N. Ponomaryov, and Vladimir E. Bondybey, Electron traps in solid Xe, Low Temp. Phys. 35, (2009) [Fiz. Nizk. Temp. 35, 433-437, (2009)] DOI: https://doi.org/10.1063/1.3117964.
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