Low temperature microhardness of Xe-intercalated fullerite C60
DOI:
https://doi.org/10.1063/1.1925374Ключові слова:
PACS: 81.05.Tp, 62.20.Qp, 81.40.CdАнотація
The Vickers microhardness of Xe-intercalated polycrystalline fullerite C60 (Xex C60, x ≃ 0.35) is measured in a moderately low temperature range of 77 to 300 K. A high increase in the microhardness of the material (by a factor of 2 to 3) as compared to that of pure C60 single crystals is observed. It is shown that the step-like anomaly in the temperature dependences of the microhardness of pure C60 single crystals recorded under the orientational fcc-sc phase transition (Tc ≃ 260 K) is also qualitatively retained for Xex C60, but its onset is shifted by 40 K towards lower temperatures and the step becomes less distinct and more smeared. This behavior of H̅V(T)correlates with x-ray diffraction data, the analysis of which revealed a considerable influence of xenon interstitial atoms on the peculiar features of fullerite thermal expansion due to orientational phase transitions (see the paper by A.I. Prokhvatilov et al. in this issue).Завантаження
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Опубліковано
2005-03-21
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(1)
Fomenko, L.; Lubenets, S.; Natsik, V.; Cassidy, D.; Gadd, G.; Moricca, S.; Sundqvist, B. Low Temperature Microhardness of Xe-Intercalated Fullerite C60. Fiz. Nizk. Temp. 2005, 31, 596-601.
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Низькотемпеpатуpна фізика пластичності та міцності