Fluctuation conductivity in Y-Ba-Cu-O films with artificially produced defects

Автор(и)

  • A. L. Solovjov B. Verkin Institute for Low Temperature Physics and Engineering, National Academy of Sciences of Ukraine, 47 Lenin Ave., 61103 Kharkov, Ukraine

DOI (Low Temperature Physics):


https://doi.org/10.1063/1.1528572

Ключові слова:

PACS: 74.40. k

Анотація

The fluctuation-induced conductivity (paraconductivity) measured in YBa2Cu3O7-d (YBCO) films grown on 10° miscut SrTiO3 (001) substrates is analyzed using various theoretical models describing weak fluctuations in high-Tc superconductors and considering both Aslamazov-Larkin and Maki-Thompson fluctuation contributions in the clean limit approach. The analysis reveals a highly anisotropic pair-breaking caused by structural defects produced. This result is in favor of an idea that pseudogap in high-Tc oxydes is mainly governed by the fluctuating pairing.

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Опубліковано

2002-10-02

Як цитувати

(1)
A. L. Solovjov, Fluctuation conductivity in Y-Ba-Cu-O films with artificially produced defects, Low Temp. Phys. 28, (2002) [Fiz. Nizk. Temp. 28, 1138-1149, (2002)] DOI: https://doi.org/10.1063/1.1528572.

Номер

Том 28 № 11 (2002)

Розділ

Надпровідність, зокрема високотемпературна

Завантаження

Дані завантаження ще не доступні.

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