Mapping of 2D contact perturbations by electrons on a helium film

Автор(и)

  • E. Teske Grenoble High Magnetic Field Laboratory, Max-Plank Institut fur Festkorperforschung Centre National de la Recherche Scientifique, B.P.166, F-38042, Grenoble, Cedex 9, France
  • P. Wyder Grenoble High Magnetic Field Laboratory, Max-Plank Institut fur Festkorperforschung Centre National de la Recherche Scientifique, B.P.166, F-38042, Grenoble, Cedex 9, France
  • P. Leiderer Fakultet fur Physik, Universitet Konstanz, D-78434 Konstanz, Germany
  • V. Shikin Institute of Solid State Physics, 142432 Chernogolovka, Moscow District, Russia

DOI:

https://doi.org/10.1063/1.593553

Ключові слова:

PACS: 67.40.-w, 67.70. n

Анотація

A promising way to investigate 2D contact phenomena is proposed. This method is based on the idea of depositing surface state electrons (SSE) on a thin layer of liquid helium covering the surface of a solid sample containing a 2D charge carrier system. The density of SSE adjusts to screen contact-induced perturbations of the electrostatic potential across the sample. As a result, the helium layer thickness varies due to the variation of the electrostatic pressure, thus providing a map. This map may be read off interferometrically by a technique already employed for the investigation of multi-electron dimples on helium. We have realized this mapping for a structured electrode as a test sample to demonstrate the resolution of the method.

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Опубліковано

1998-02-10

Як цитувати

(1)
Teske, E.; Wyder, P.; Leiderer, P.; Shikin, V. Mapping of 2D Contact Perturbations by Electrons on a Helium Film. Fiz. Nizk. Temp. 1998, 24, 163-165.

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