Veremeichyk, T. V. ., Makarenko, O. V. ., Shevchenko, V. B. ., Ivanchuk, S. Y. ., & Rybalochka, A. V. . (2024). Investigation of multilayer samples of porous silicon with periodic structure by spectroscopic ellipsometry . ФІЗИКА НИЗЬКИХ ТЕМПЕРАТУР, 51(2), 261–266. вилучено із https://fnt.ilt.kharkiv.ua/index.php/fnt/article/view/9404